A novel development for areal chromatic confocal measurements has been published in an international research journal:
The new metrology device capable of performing one-shot areal surface profile measurements for inline process monitoring.
Chromatic confocal metrology suffers from a limitation in the number of measurement points that can be measured simultaneously in a single frame acquisition. We propose chromatic confocal areal metrology (ChromaCAM), in which the surface height for each point in a 2D grid of measurement spots, generated by a rectangular micro-lens array, is parallely analyzed through the utilization of a pinhole multiplexer unit, an analog optical analysis unit, and postprocessing algorithms. An experiment shows the viability of the simultaneous acquisition of multiple measurement points and the advantages over exisiting areal chromatic confocal approaches. Compared with conventional chromatic confocal metrology, the increase in the acquisition rate is significant and enables one-shot measurements.
Zitation:
Korbinian Prause, Alois M. Herkommer, and Michael Layh "Toward areal chromatic confocal metrology," Optical Engineering 62(3), 034101 (1 March 2023).
https://doi.org/10.1117/1.OE.62.3.034101